@article{article87942ed5,
title   = {Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs},
author = {Rodrigues, M. and Martino, João Antonio and Mercha, A. and Collaert, Nadine and Simoen, Eddy and Claeys, Cor},
year = {2010},
doi = {10.1016/j.sse.2010.07.007},
journal   = {Solid-State Electronics}
}