@article{articlebf74edb7,
title   = {Improved analytical model for ZTC bias point for strained Tri-gates FinFETs},
author = {Almeida, Luciano Mendes and Martino, João Antonio and Simoen, Eddy and Claeys, Cor},
year = {2010},
doi = {10.1149/1.3474183},
journal   = {Microelectronics Technology and Devices - SBMicro 2010}
}