@inproceedings{inproceedings8447052f,
title   = {Influence of fin width on the intrinsic voltage gain of standard and strained triple-gate nFinFETs},
author = {Pavanello, Marcelo Antonio and Martino, João Antonio and Simoen, Eddy and Rooyackers, Rita and Collaert, Nadine and Claeys, Cor},
year = {2008},
publisher = {The Electrochemical Society},
booktitle   = {International Symposium on Microelectronics Technology and Devices SBMICRO}
}