@article{article66654c43,
title   = {Analysis of transition region and accumulation layer effect in the subthreshold slope in SOI nMOSFETs and their influences on the interface trap density extraction},
author = {Sonnenberg, Victor and Martino, João Antonio},
year = {1999},
doi = {10.1016/s0038-1101(99)00191-4},
journal   = {Solid-State Electronics}
}