@inproceedings{inproceedings9f120401,
title   = {Influence of the gate oxide tunneling effect on the extraction of the silicon film and front oxide thickness in SOI nMOSFET},
author = {Paiola, A.G. and Nicolett, Aparecido Sirley and Martino, João Antonio},
year = {2005},
publisher = {The Electrochemical Society},
booktitle   = {International Symposium on Microelectronics Technology and Devices SBMICRO}
}