@inbook{inbook387c198d,
title   = {Comparison between the leakage drain current behavior in SOI pMOSFETs and SOI nMOSFETs operating at 300°C},
author = {Bellodi, Marcello and Martino, João Antonio},
year = {2003},
publisher = {Electrochemical Society},
journal   = {Microelectronic Technology and Devices SBMicro 2003}
}