@inbook{inbookf207b394,
title   = {The leakage drain current behavior in graded-channel SOI nMOSFETs operating up to 300°C},
author = {Bellodi, Marcello and Martino, João Antonio},
year = {2003},
publisher = {Electrochemical Society},
journal   = {Microelectronic Technology and Devices SBMicro 2003}
}