@article{articleeeb8eb3a,
title   = {Study of the leakage drain current carriers in silicon-on-insulator MOSFETs at high temperatures},
author = {Bellodi, Marcello and Martino, João Antonio},
year = {2001},
doi = {10.1016/s0038-1101(01)00099-5},
journal   = {Solid-State Electronics}
}