@inproceedings{inproceedings53b93863,
title   = {A new method to extract the silicon film thickness of enhancement mode fully depleted SOI nMOSFETs},
author = {Nicolett, Aparecido Sirley and Martino, João Antonio and Simoen, Eddy and Claeys, Cor},
year = {2000},
publisher = {IEEE/SBC},
booktitle   = {IEEE Latin American Test Workshop}
}