@inproceedings{inproceedings97e9cdb2,
title   = {Effective channel length and series resistence extraction error induced by the substrate in enhancement-mode SOI nMOSFETs},
author = {Pavanello, Marcelo Antonio and Nicolett, Aparecido Sirley and Martino, João Antonio},
year = {2000},
publisher = {IEEE/SBC},
booktitle   = {IEEE Latin American Test Workshop}
}