@inproceedings{inproceedings4c4f7f17,
title   = {Modeling of the leakage drain current in accumulation mode SOI pMOSFETs for high-temperature applications},
author = {Bellodi, Marcello and Iniguez, Benjamin and Flandre, Denis and Martino, João Antonio},
year = {2001},
publisher = {The Electrochemical Society},
booktitle   = {International Symposium on Silicon-on-Insulator Technology and Devices}
}