@inproceedings{inproceedings35d5700b,
title   = {Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures},
author = {Bellodi, Marcello and Iniguez, Benjamin and Raynaud, Cristine and Flandre, Denis and Martino, João Antonio},
year = {2000},
publisher = {SBMicro/UA/UFRGS/UNICAMP/USP},
booktitle   = {International Conference on Microelectronics and Packaging}
}