@inproceedings{inproceedings580f540d,
title   = {Diodes model for the leakage drain current in enhancement-mode SOI nMOSFETs at 300°C},
author = {Bellodi, Marcello and Iniguez, Benjamin and Flandre, Denis and Martino, João Antonio},
year = {2000},
publisher = {SBMicro/UA/UFRGS/UNICAMP/USP},
booktitle   = {International Conference on Microelectronics and Packaging}
}