@inproceedings{inproceedings2c4382dc,
title   = {Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM},
author = {Raposo, Maria and Lobo, R F M and Silva, Marcelo de Assumpção Pereira da and Faria, Roberto Mendonça and Oliveira Junior, Osvaldo Novais de},
year = {1999},
publisher = {IEEE},
booktitle   = {International Symposium on Electrets}
}