@inproceedings{inproceedingsac7f33d7,
title   = {A new method for determination of the fixed charge density at the buried oxide/underlying substrate interface in accumulation-mode P-channel SOI MOSFETs. (em CD-Rom)},
author = {Martino, João Antonio and Pavanello, Marcelo Antonio},
year = {1997},
publisher = {SBMICRO/EFEI},
booktitle   = {Conference of the Brazilian Microelectronics Society}
}