@inproceedings{inproceedings83cb0dde,
title   = {New leakage drain current model for high temperature soi mesfet},
author = {Bellodi, Marcello and Martino, João Antonio and Flandre, M},
year = {1995},
publisher = {Instituto de Informatica da Ufrgs},
booktitle   = {Congress of the Brazilian Microelectronics Society}
}