@article{articlefcbd6188,
title   = {Simple method for the determination of the interface trap density at 77k in fully depleted acumulation mode soi mosfets},
author = {Martino, João Antonio and Simoen, Eddy and Magnusson, Ulf and Rotondaro, Antônio Luís Pacheco and Claeys, Cor},
year = {1993},
journal   = {Solid State Electronics}
}