@inproceedings{inproceedings111c892d,
title   = {Use of the charge pumping technique for the evaluation of mosfet degradation due to stress in silicide / polysilicon double layer},
author = {Santos Filho, Sebastião Gomes dos and Swart, Jacobus Willibrordus},
year = {1990},
publisher = {Sbmicro/Spie},
booktitle   = {Congresso da Sociedade Brasileira de Microeletronica}
}