Source: Microelectronics Technology and Devices SBMICRO 2002. Unidade: EP
Assunto: MICROELETRÔNICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NAVIA, Alan Rodrigo e SANTOS FILHO, Sebastião Gomes dos. Electrical and physical characterization of electroless nickel films on polysilicon gate electrodes. Microelectronics Technology and Devices SBMICRO 2002. Tradução . Pennington: The Electrochemical Society, 2002. . . Acesso em: 16 nov. 2025.APA
Navia, A. R., & Santos Filho, S. G. dos. (2002). Electrical and physical characterization of electroless nickel films on polysilicon gate electrodes. In Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society.NLM
Navia AR, Santos Filho SG dos. Electrical and physical characterization of electroless nickel films on polysilicon gate electrodes. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2025 nov. 16 ]Vancouver
Navia AR, Santos Filho SG dos. Electrical and physical characterization of electroless nickel films on polysilicon gate electrodes. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2025 nov. 16 ]

