Stoichiometry, surface and structural characterization of lead iodide thin films (2006)
Fonte: Brazilian Journal of Physics. Unidade: FFCLRP
Assuntos: FILMES FINOS, SEMICONDUTORES
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ABNT
CONDELES, J. F. et al. Stoichiometry, surface and structural characterization of lead iodide thin films. Brazilian Journal of Physics, v. 36, n. 2A, p. 320-323, 2006Tradução . . Disponível em: https://doi.org/10.1590/s0103-97332006000300023. Acesso em: 12 nov. 2025.APA
Condeles, J. F., Lofrano, R. C. Z., Rosolen, J. M., & Mulato, M. (2006). Stoichiometry, surface and structural characterization of lead iodide thin films. Brazilian Journal of Physics, 36( 2A), 320-323. doi:10.1590/s0103-97332006000300023NLM
Condeles JF, Lofrano RCZ, Rosolen JM, Mulato M. Stoichiometry, surface and structural characterization of lead iodide thin films [Internet]. Brazilian Journal of Physics. 2006 ; 36( 2A): 320-323.[citado 2025 nov. 12 ] Available from: https://doi.org/10.1590/s0103-97332006000300023Vancouver
Condeles JF, Lofrano RCZ, Rosolen JM, Mulato M. Stoichiometry, surface and structural characterization of lead iodide thin films [Internet]. Brazilian Journal of Physics. 2006 ; 36( 2A): 320-323.[citado 2025 nov. 12 ] Available from: https://doi.org/10.1590/s0103-97332006000300023
