Filtros : "Journal of Integrated Circuits and Systems" "2023" Limpar

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  • Source: Journal of Integrated Circuits and Systems. Unidade: EP

    Subjects: TRANSISTORES, SOLUÇÕES

    Versão PublicadaAcesso à fonteDOIHow to cite
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    • ABNT

      DUARTE, Pedro Henrique et al. ISFET fabrication and characterization for hydrogen peroxide sensing. Journal of Integrated Circuits and Systems, v. 18, n. 1, p. 1-4, 2023Tradução . . Disponível em: https://doi.org/10.29292/jics.v18i1.646. Acesso em: 16 nov. 2025.
    • APA

      Duarte, P. H., Rangel, R. C., Ramos, D. A., Yojo, L. S., Mori, C. A. B., Sasaki, K. R. A., et al. (2023). ISFET fabrication and characterization for hydrogen peroxide sensing. Journal of Integrated Circuits and Systems, 18( 1), 1-4. doi:10.29292/jics.v18i1.646
    • NLM

      Duarte PH, Rangel RC, Ramos DA, Yojo LS, Mori CAB, Sasaki KRA, Agopian PGD, Martino JA. ISFET fabrication and characterization for hydrogen peroxide sensing [Internet]. Journal of Integrated Circuits and Systems. 2023 ; 18( 1): 1-4.[citado 2025 nov. 16 ] Available from: https://doi.org/10.29292/jics.v18i1.646
    • Vancouver

      Duarte PH, Rangel RC, Ramos DA, Yojo LS, Mori CAB, Sasaki KRA, Agopian PGD, Martino JA. ISFET fabrication and characterization for hydrogen peroxide sensing [Internet]. Journal of Integrated Circuits and Systems. 2023 ; 18( 1): 1-4.[citado 2025 nov. 16 ] Available from: https://doi.org/10.29292/jics.v18i1.646
  • Source: Journal of Integrated Circuits and Systems. Unidade: EP

    Subjects: FRACTAIS, SIMULAÇÃO, AVALIAÇÃO DE DESEMPENHO

    Versão PublicadaAcesso à fonteDOIHow to cite
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    • ABNT

      FERNANDES, Lucas Almir dos Santos e ALAYO CHÁVEZ, Marco Isaías e MARTINO, João Antonio. Fractional-order MOS capacitor: experimental results and Monte Carlo analysis. Journal of Integrated Circuits and Systems, v. 18, n. 1, p. 1-5, 2023Tradução . . Disponível em: https://doi.org/10.29292/jics.v18i1.660. Acesso em: 16 nov. 2025.
    • APA

      Fernandes, L. A. dos S., Alayo Chávez, M. I., & Martino, J. A. (2023). Fractional-order MOS capacitor: experimental results and Monte Carlo analysis. Journal of Integrated Circuits and Systems, 18( 1), 1-5. doi:10.29292/jics.v18i1.660
    • NLM

      Fernandes LA dos S, Alayo Chávez MI, Martino JA. Fractional-order MOS capacitor: experimental results and Monte Carlo analysis [Internet]. Journal of Integrated Circuits and Systems. 2023 ; 18( 1): 1-5.[citado 2025 nov. 16 ] Available from: https://doi.org/10.29292/jics.v18i1.660
    • Vancouver

      Fernandes LA dos S, Alayo Chávez MI, Martino JA. Fractional-order MOS capacitor: experimental results and Monte Carlo analysis [Internet]. Journal of Integrated Circuits and Systems. 2023 ; 18( 1): 1-5.[citado 2025 nov. 16 ] Available from: https://doi.org/10.29292/jics.v18i1.660
  • Source: Journal of Integrated Circuits and Systems. Unidade: EP

    Subjects: TRANSISTORES, CIRCUITOS ANALÓGICOS, NANOTECNOLOGIA

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    • ABNT

      TOLEDO, Rodrigo do Nascimento e MARTINO, João Antonio e AGOPIAN, Paula Ghedini Der. Low-dropout voltage regulator designed with nanowire TFET with different source composition experimental data. Journal of Integrated Circuits and Systems, v. 18, n. 1, p. 1-6, 2023Tradução . . Disponível em: https://doi.org/10.29292/jics.v18i1.653. Acesso em: 16 nov. 2025.
    • APA

      Toledo, R. do N., Martino, J. A., & Agopian, P. G. D. (2023). Low-dropout voltage regulator designed with nanowire TFET with different source composition experimental data. Journal of Integrated Circuits and Systems, 18( 1), 1-6. doi:10.29292/jics.v18il.653
    • NLM

      Toledo R do N, Martino JA, Agopian PGD. Low-dropout voltage regulator designed with nanowire TFET with different source composition experimental data [Internet]. Journal of Integrated Circuits and Systems. 2023 ;18( 1): 1-6.[citado 2025 nov. 16 ] Available from: https://doi.org/10.29292/jics.v18i1.653
    • Vancouver

      Toledo R do N, Martino JA, Agopian PGD. Low-dropout voltage regulator designed with nanowire TFET with different source composition experimental data [Internet]. Journal of Integrated Circuits and Systems. 2023 ;18( 1): 1-6.[citado 2025 nov. 16 ] Available from: https://doi.org/10.29292/jics.v18i1.653

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