Silva, Carlos J. da; Andrade, A. A.; Marletta, A.; Faria, Roberto Mendonça 
; Catunda, Tomaz ; Cury, L. A.
Fonte: Advance Programme. Nome do evento: European Conference on Lasers and Electro-Optics - CLEO EUROPE. Unidade: IFSC
Assuntos: POLÍMEROS (MATERIAIS), FILMES FINOS, SEMICONDUTORES, LENTES
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ABNT
SILVA, Carlos J. da et al. Multiwavelength thermal lens determination of quantum efficiency of thin films of semiconductor polymers. 2003, Anais.. Piscataway: IEEE Institute of Electrical and Eletronics Engineers, 2003. . Acesso em: 30 nov. 2025.APA
Silva, C. J. da, Andrade, A. A., Marletta, A., Faria, R. M., Catunda, T., & Cury, L. A. (2003). Multiwavelength thermal lens determination of quantum efficiency of thin films of semiconductor polymers. In Advance Programme. Piscataway: IEEE Institute of Electrical and Eletronics Engineers.NLM
Silva CJ da, Andrade AA, Marletta A, Faria RM, Catunda T, Cury LA. Multiwavelength thermal lens determination of quantum efficiency of thin films of semiconductor polymers. Advance Programme. 2003 ;[citado 2025 nov. 30 ]Vancouver
Silva CJ da, Andrade AA, Marletta A, Faria RM, Catunda T, Cury LA. Multiwavelength thermal lens determination of quantum efficiency of thin films of semiconductor polymers. Advance Programme. 2003 ;[citado 2025 nov. 30 ]
