Design-point excitation for crack propagation under narrow-band random loading (2012)
Moustapha, Maliki; Bourinet, Jean-Marc; Beck, André Teófilo 
Fonte: Proceedings. Nome do evento: International Symposium on Uncertainty Quantification and Stochastic Modeling. Unidade: EESC
Assuntos: FADIGA DOS MATERIAIS, DESENVOLVIMENTO DE SOFTWARE
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MOUSTAPHA, Maliki e BOURINET, Jean-Marc e BECK, André Teófilo. Design-point excitation for crack propagation under narrow-band random loading. 2012, Anais.. São Carlos: SBMAC, 2012. . Acesso em: 11 nov. 2025.APA
Moustapha, M., Bourinet, J. -M., & Beck, A. T. (2012). Design-point excitation for crack propagation under narrow-band random loading. In Proceedings. São Carlos: SBMAC.NLM
Moustapha M, Bourinet J-M, Beck AT. Design-point excitation for crack propagation under narrow-band random loading. Proceedings. 2012 ;[citado 2025 nov. 11 ]Vancouver
Moustapha M, Bourinet J-M, Beck AT. Design-point excitation for crack propagation under narrow-band random loading. Proceedings. 2012 ;[citado 2025 nov. 11 ]
