Araújo, Hugo Puertas de; Santos Filho, Sebastião Gomes dos 
Fonte: Microelectronics Technology and Devices SBMICRO 2002. Unidade: EP
Assunto: MICROELETRÔNICA
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ARAÚJO, Hugo Puertas de e SANTOS FILHO, Sebastião Gomes dos. Polarization-difference imaging technique for material characterization: algorithm and some applications. Microelectronics Technology and Devices SBMICRO 2002. Tradução . Pennington: The Electrochemical Society, 2002. . . Acesso em: 17 nov. 2025.APA
Araújo, H. P. de, & Santos Filho, S. G. dos. (2002). Polarization-difference imaging technique for material characterization: algorithm and some applications. In Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society.NLM
Araújo HP de, Santos Filho SG dos. Polarization-difference imaging technique for material characterization: algorithm and some applications. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2025 nov. 17 ]Vancouver
Araújo HP de, Santos Filho SG dos. Polarization-difference imaging technique for material characterization: algorithm and some applications. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2025 nov. 17 ]
