Lourenço, João Miguel; Lebensztajn, Luiz 
Fonte: IEEE Transactions on Magnetics. Unidade: EP
Assuntos: MÉTODO DOS ELEMENTOS FINITOS, ELETROMAGNETISMO
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LOURENÇO, João Miguel e LEBENSZTAJN, Luiz. Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization. IEEE Transactions on Magnetics, v. 51, n. 3, p. 1-4, 2015Tradução . . Disponível em: https://doi.org/10.1109/tmag.2014.2362980. Acesso em: 12 nov. 2025.APA
Lourenço, J. M., & Lebensztajn, L. (2015). Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization. IEEE Transactions on Magnetics, 51( 3), 1-4. doi:10.1109/tmag.2014.2362980NLM
Lourenço JM, Lebensztajn L. Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization [Internet]. IEEE Transactions on Magnetics. 2015 ; 51( 3): 1-4.[citado 2025 nov. 12 ] Available from: https://doi.org/10.1109/tmag.2014.2362980Vancouver
Lourenço JM, Lebensztajn L. Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization [Internet]. IEEE Transactions on Magnetics. 2015 ; 51( 3): 1-4.[citado 2025 nov. 12 ] Available from: https://doi.org/10.1109/tmag.2014.2362980
