Rubim, Joel Camargo 
; Kim, J H; Henderson, E; Cotton, T M
Fonte: Applied Spectroscopy. Unidade: IQ
Assuntos: QUÍMICA AMBIENTAL, ESPECTROSCOPIA
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RUBIM, Joel Camargo et al. Surface enhance raman scattering and atomic force microscopy of brass electrodes in sulfuric acid solution containing benzotriazole and chloride ion. Applied Spectroscopy, v. 47, p. 80-4, 1993Tradução . . Acesso em: 15 nov. 2025.APA
Rubim, J. C., Kim, J. H., Henderson, E., & Cotton, T. M. (1993). Surface enhance raman scattering and atomic force microscopy of brass electrodes in sulfuric acid solution containing benzotriazole and chloride ion. Applied Spectroscopy, 47, 80-4.NLM
Rubim JC, Kim JH, Henderson E, Cotton TM. Surface enhance raman scattering and atomic force microscopy of brass electrodes in sulfuric acid solution containing benzotriazole and chloride ion. Applied Spectroscopy. 1993 ;47 80-4.[citado 2025 nov. 15 ]Vancouver
Rubim JC, Kim JH, Henderson E, Cotton TM. Surface enhance raman scattering and atomic force microscopy of brass electrodes in sulfuric acid solution containing benzotriazole and chloride ion. Applied Spectroscopy. 1993 ;47 80-4.[citado 2025 nov. 15 ]
