Fonte: Proceedings. Nome do evento: Conference of the Brazilian Microelectronics Society. Unidade: EP
Assuntos: CIRCUITOS INTEGRADOS, SEMICONDUTORES
ABNT
TORRES, Luiz Carlos Molina e BRAGA, Nelson Liebentritt de Almeida. On` the measurement of stripe temperatures during electromigration characterization by BEM. (em CD-Rom). 1997, Anais.. Itajubá: SBMICRO/EFEI, 1997. . Acesso em: 15 nov. 2025.APA
Torres, L. C. M., & Braga, N. L. de A. (1997). On` the measurement of stripe temperatures during electromigration characterization by BEM. (em CD-Rom). In Proceedings. Itajubá: SBMICRO/EFEI.NLM
Torres LCM, Braga NL de A. On` the measurement of stripe temperatures during electromigration characterization by BEM. (em CD-Rom). Proceedings. 1997 ;[citado 2025 nov. 15 ]Vancouver
Torres LCM, Braga NL de A. On` the measurement of stripe temperatures during electromigration characterization by BEM. (em CD-Rom). Proceedings. 1997 ;[citado 2025 nov. 15 ]