Filtros : "ANDRADE FILHO, MÁRIO DE CASTRO" "IFSC223" Limpar

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  • Source: International Journal of Bifurcation and Chaos in Applied Sciences and Engineering. Unidades: ICMC, IFSC

    Subjects: FRACTAIS, INFERÊNCIA BAYESIANA, ESTATÍSTICA APLICADA, ANÁLISE DE DADOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      FLORINDO, João Batista e CASTRO, Mário de e BRUNO, Odemir Martinez. Enhancing multiscale fractal descriptors using functional data analysis. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering, v. 20, n. 11, p. 3443-3460, 2010Tradução . . Disponível em: https://doi.org/10.1142/S0218127410027805. Acesso em: 31 out. 2024.
    • APA

      Florindo, J. B., Castro, M. de, & Bruno, O. M. (2010). Enhancing multiscale fractal descriptors using functional data analysis. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering, 20( 11), 3443-3460. doi:10.1142/S0218127410027805
    • NLM

      Florindo JB, Castro M de, Bruno OM. Enhancing multiscale fractal descriptors using functional data analysis [Internet]. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering. 2010 ; 20( 11): 3443-3460.[citado 2024 out. 31 ] Available from: https://doi.org/10.1142/S0218127410027805
    • Vancouver

      Florindo JB, Castro M de, Bruno OM. Enhancing multiscale fractal descriptors using functional data analysis [Internet]. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering. 2010 ; 20( 11): 3443-3460.[citado 2024 out. 31 ] Available from: https://doi.org/10.1142/S0218127410027805

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