Source: IEEE Transactions on Magnetics. Unidade: EP
Subjects: MÉTODO DOS ELEMENTOS FINITOS, ELETROMAGNETISMO
ABNT
LOURENÇO, João Miguel e LEBENSZTAJN, Luiz. Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization. IEEE Transactions on Magnetics, v. 51, n. 3, p. 1-4, 2015Tradução . . Disponível em: https://doi.org/10.1109/tmag.2014.2362980. Acesso em: 30 set. 2024.APA
Lourenço, J. M., & Lebensztajn, L. (2015). Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization. IEEE Transactions on Magnetics, 51( 3), 1-4. doi:10.1109/tmag.2014.2362980NLM
Lourenço JM, Lebensztajn L. Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization [Internet]. IEEE Transactions on Magnetics. 2015 ; 51( 3): 1-4.[citado 2024 set. 30 ] Available from: https://doi.org/10.1109/tmag.2014.2362980Vancouver
Lourenço JM, Lebensztajn L. Surrogate Modeling and Two-Level Infill Criteria Applied to Electromagnetic Device Optimization [Internet]. IEEE Transactions on Magnetics. 2015 ; 51( 3): 1-4.[citado 2024 set. 30 ] Available from: https://doi.org/10.1109/tmag.2014.2362980