Atomic force microscopy studies on various types of photoluminescent porous silicon (1994)
Source: International Journal of Optoelectronics. Unidade: IFSC
Assunto: MATÉRIA CONDENSADA
ABNT
GRIVICKAS, V et al. Atomic force microscopy studies on various types of photoluminescent porous silicon. International Journal of Optoelectronics, v. 9 , n. 4 , p. 303-9, 1994Tradução . . Acesso em: 10 nov. 2024.APA
Grivickas, V., Baranauskas, V., Rodrigues, C. R., Basmaji, P., & Misoguti, L. (1994). Atomic force microscopy studies on various types of photoluminescent porous silicon. International Journal of Optoelectronics, 9 ( 4 ), 303-9.NLM
Grivickas V, Baranauskas V, Rodrigues CR, Basmaji P, Misoguti L. Atomic force microscopy studies on various types of photoluminescent porous silicon. International Journal of Optoelectronics. 1994 ;9 ( 4 ): 303-9.[citado 2024 nov. 10 ]Vancouver
Grivickas V, Baranauskas V, Rodrigues CR, Basmaji P, Misoguti L. Atomic force microscopy studies on various types of photoluminescent porous silicon. International Journal of Optoelectronics. 1994 ;9 ( 4 ): 303-9.[citado 2024 nov. 10 ]