Antonelli, Alex; Justo Filho, João Francisco 
; Fazzio, Adalberto
Source: Journal of Applied Physics. Unidade: IF
Subjects: SEMICONDUTORES, MATERIAIS (PROPRIEDADES ELÉTRICAS), ESTRUTURA ELETRÔNICA
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ABNT
ANTONELLI, Alex e JUSTO FILHO, João Francisco e FAZZIO, Adalberto. Interaction of As impurities with 30'GRAUS' partial dislocations in Si: an ab initio investigation. Journal of Applied Physics, v. 91, n. 9, p. 5892-5895, 2002Tradução . . Disponível em: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000091000009005892000001&idtype=cvips. Acesso em: 19 nov. 2025.APA
Antonelli, A., Justo Filho, J. F., & Fazzio, A. (2002). Interaction of As impurities with 30'GRAUS' partial dislocations in Si: an ab initio investigation. Journal of Applied Physics, 91( 9), 5892-5895. Recuperado de http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000091000009005892000001&idtype=cvipsNLM
Antonelli A, Justo Filho JF, Fazzio A. Interaction of As impurities with 30'GRAUS' partial dislocations in Si: an ab initio investigation [Internet]. Journal of Applied Physics. 2002 ; 91( 9): 5892-5895.[citado 2025 nov. 19 ] Available from: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000091000009005892000001&idtype=cvipsVancouver
Antonelli A, Justo Filho JF, Fazzio A. Interaction of As impurities with 30'GRAUS' partial dislocations in Si: an ab initio investigation [Internet]. Journal of Applied Physics. 2002 ; 91( 9): 5892-5895.[citado 2025 nov. 19 ] Available from: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000091000009005892000001&idtype=cvips
