Mandaji, Marcos; Rübensam, Gabriel; Hoff, Rodrigo Barcellos; Hillebrand, Sandro; Carrilho, Emanuel 
; Kist, Tarso Ledur
Source: Electrophoresis. Unidade: IQSC
Subjects: QUÍMICA, ELETROFORESE
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MANDAJI, Marcos et al. Sample stacking in CZE using dynamic thermal junctions II.: analytes with high dpKa/dT crossing a single thermal induced junction in a BGE with dpH/dT. Electrophoresis, v. 30, n. 9, p. 1510-1515, 2009Tradução . . Disponível em: http://www3.interscience.wiley.com/cgi-bin/fulltext/122304926/PDFSTART. Acesso em: 15 set. 2024.APA
Mandaji, M., Rübensam, G., Hoff, R. B., Hillebrand, S., Carrilho, E., & Kist, T. L. (2009). Sample stacking in CZE using dynamic thermal junctions II.: analytes with high dpKa/dT crossing a single thermal induced junction in a BGE with dpH/dT. Electrophoresis, 30( 9), 1510-1515. Recuperado de http://www3.interscience.wiley.com/cgi-bin/fulltext/122304926/PDFSTARTNLM
Mandaji M, Rübensam G, Hoff RB, Hillebrand S, Carrilho E, Kist TL. Sample stacking in CZE using dynamic thermal junctions II.: analytes with high dpKa/dT crossing a single thermal induced junction in a BGE with dpH/dT [Internet]. Electrophoresis. 2009 ; 30( 9): 1510-1515.[citado 2024 set. 15 ] Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/122304926/PDFSTARTVancouver
Mandaji M, Rübensam G, Hoff RB, Hillebrand S, Carrilho E, Kist TL. Sample stacking in CZE using dynamic thermal junctions II.: analytes with high dpKa/dT crossing a single thermal induced junction in a BGE with dpH/dT [Internet]. Electrophoresis. 2009 ; 30( 9): 1510-1515.[citado 2024 set. 15 ] Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/122304926/PDFSTART
