Time-of-flight secondary ion mass spectroscopy or organic monolayer on Si(111) (2006)
Rodrigues Filho, Ubirajara Pereira 
; Villeneuve, Catherine Henry de; Chazalviel, Jean-Nöel; Ozanam, François; Brison, Jéremy; Douhard, Bastien; Pireaux, Jean-Jacques; Houssiau, Laurent; Allongue, Philippe
Fonte: Abstract book. Nome do evento: International Conference on Electronic Spectroscopy and Structure - ICESS. Unidade: IQSC
Assuntos: QUÍMICA, MATÉRIA CONDENSADA
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RODRIGUES FILHO, Ubirajara Pereira et al. Time-of-flight secondary ion mass spectroscopy or organic monolayer on Si(111). 2006, Anais.. São Carlos: Suprema, 2006. Disponível em: http://www.lnls.br/icess10/ICESS10_%20Abstract%20Book%20Versao%20corrigida.pdf. Acesso em: 09 nov. 2025.APA
Rodrigues Filho, U. P., Villeneuve, C. H. de, Chazalviel, J. -N., Ozanam, F., Brison, J., Douhard, B., et al. (2006). Time-of-flight secondary ion mass spectroscopy or organic monolayer on Si(111). In Abstract book. São Carlos: Suprema. Recuperado de http://www.lnls.br/icess10/ICESS10_%20Abstract%20Book%20Versao%20corrigida.pdfNLM
Rodrigues Filho UP, Villeneuve CH de, Chazalviel J-N, Ozanam F, Brison J, Douhard B, Pireaux J-J, Houssiau L, Allongue P. Time-of-flight secondary ion mass spectroscopy or organic monolayer on Si(111) [Internet]. Abstract book. 2006 ;[citado 2025 nov. 09 ] Available from: http://www.lnls.br/icess10/ICESS10_%20Abstract%20Book%20Versao%20corrigida.pdfVancouver
Rodrigues Filho UP, Villeneuve CH de, Chazalviel J-N, Ozanam F, Brison J, Douhard B, Pireaux J-J, Houssiau L, Allongue P. Time-of-flight secondary ion mass spectroscopy or organic monolayer on Si(111) [Internet]. Abstract book. 2006 ;[citado 2025 nov. 09 ] Available from: http://www.lnls.br/icess10/ICESS10_%20Abstract%20Book%20Versao%20corrigida.pdf
