STEM-EDX tomography of bimetallic nanoparticles: a methodological investigation (2016)
Slater, Thomas J. A; Janssen, Arne; Camargo, Pedro Henrique Cury de 
; Burke, M. Grace; Zaluzec, Nestor J; Haigh, Sarah J
Source: Ultramicroscopy. Unidade: IQ
Subjects: ESPECTROSCOPIA DE RAIO X, NANOPARTÍCULAS
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ABNT
SLATER, Thomas J. A et al. STEM-EDX tomography of bimetallic nanoparticles: a methodological investigation. Ultramicroscopy, v. 162, p. 61-73, 2016Tradução . . Disponível em: https://doi.org/10.1016/j.ultramic.2015.10.007. Acesso em: 19 nov. 2024.APA
Slater, T. J. A., Janssen, A., Camargo, P. H. C. de, Burke, M. G., Zaluzec, N. J., & Haigh, S. J. (2016). STEM-EDX tomography of bimetallic nanoparticles: a methodological investigation. Ultramicroscopy, 162, 61-73. doi:10.1016/j.ultramic.2015.10.007NLM
Slater TJA, Janssen A, Camargo PHC de, Burke MG, Zaluzec NJ, Haigh SJ. STEM-EDX tomography of bimetallic nanoparticles: a methodological investigation [Internet]. Ultramicroscopy. 2016 ; 162 61-73.[citado 2024 nov. 19 ] Available from: https://doi.org/10.1016/j.ultramic.2015.10.007Vancouver
Slater TJA, Janssen A, Camargo PHC de, Burke MG, Zaluzec NJ, Haigh SJ. STEM-EDX tomography of bimetallic nanoparticles: a methodological investigation [Internet]. Ultramicroscopy. 2016 ; 162 61-73.[citado 2024 nov. 19 ] Available from: https://doi.org/10.1016/j.ultramic.2015.10.007
