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Filtros : "Journal of Applied Physics" "EESC-SEM" Limpar

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  • Artigo de periodico

    Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystal (2006)

    Joya, Myriam Rincon; Pizani, Paulo Sérgio; Jasinevicius, Renato Goulart ; Samad, Ricardo Elgul; Rossi, Wagner de; Vieira Junior, Nilson Dias

    Fonte: Journal of Applied Physics. Unidade: EESC

    Assunto: ESPECTROSCOPIA RAMAN

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    • ABNT

      JOYA, Myriam Rincon et al. Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystal. Journal of Applied Physics, v. 100, n. 5, p. Se 2006, 2006Tradução . . Disponível em: https://doi.org/10.1063/1.2345052. Acesso em: 09 nov. 2025.

    • APA

      Joya, M. R., Pizani, P. S., Jasinevicius, R. G., Samad, R. E., Rossi, W. de, & Vieira Junior, N. D. (2006). Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystal. Journal of Applied Physics, 100( 5), Se 2006. doi:10.1063/1.2345052

    • NLM

      Joya MR, Pizani PS, Jasinevicius RG, Samad RE, Rossi W de, Vieira Junior ND. Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystal [Internet]. Journal of Applied Physics. 2006 ; 100( 5): Se 2006.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.2345052

    • Vancouver

      Joya MR, Pizani PS, Jasinevicius RG, Samad RE, Rossi W de, Vieira Junior ND. Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystal [Internet]. Journal of Applied Physics. 2006 ; 100( 5): Se 2006.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.2345052

  • Artigo de periodico

    Raman characterization of structural disorder and residual strains in micromachined 'GA''AS' (2000)

    Pizani, P S; Lanciotti Jr., F; Jasinevicius, Renato Goulart ; Duduch, Jaime Gilberto ; Porto, Arthur José Vieira

    Fonte: Journal of Applied Physics. Unidade: EESC

    Assunto: MATÉRIA CONDENSADA (PROPRIEDADES MECÂNICAS)

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    • ABNT

      PIZANI, P S et al. Raman characterization of structural disorder and residual strains in micromachined 'GA''AS'. Journal of Applied Physics, v. 87, n. 3, p. 1280-1283, 2000Tradução . . Disponível em: https://doi.org/10.1063/1.372009. Acesso em: 09 nov. 2025.

    • APA

      Pizani, P. S., Lanciotti Jr., F., Jasinevicius, R. G., Duduch, J. G., & Porto, A. J. V. (2000). Raman characterization of structural disorder and residual strains in micromachined 'GA''AS'. Journal of Applied Physics, 87( 3), 1280-1283. doi:10.1063/1.372009

    • NLM

      Pizani PS, Lanciotti Jr. F, Jasinevicius RG, Duduch JG, Porto AJV. Raman characterization of structural disorder and residual strains in micromachined 'GA''AS' [Internet]. Journal of Applied Physics. 2000 ; 87( 3): 1280-1283.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.372009

    • Vancouver

      Pizani PS, Lanciotti Jr. F, Jasinevicius RG, Duduch JG, Porto AJV. Raman characterization of structural disorder and residual strains in micromachined 'GA''AS' [Internet]. Journal of Applied Physics. 2000 ; 87( 3): 1280-1283.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.372009
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