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Artigo de periodico
Evolution of magnetic properties and crystallographic texture in electrical steel with large plastic deformation (2011)
Fukuhara, Marcos; Yonamine, Taeko; Landgraf, Fernando José Gomes ; Missell, Frank Patrick
Source: Journal of Applied Physics. Unidade: EP
Subjects: AÇO ELÉTRICO, MAGNETISMO, CRISTALOGRAFIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
FUKUHARA, Marcos et al. Evolution of magnetic properties and crystallographic texture in electrical steel with large plastic deformation. Journal of Applied Physics, v. 109, n. 7, p. 07A325-1-07325-3, 2011Tradução . . Disponível em: https://doi.org/10.1063/1.3560895. Acesso em: 09 nov. 2025.
APA
Fukuhara, M., Yonamine, T., Landgraf, F. J. G., & Missell, F. P. (2011). Evolution of magnetic properties and crystallographic texture in electrical steel with large plastic deformation. Journal of Applied Physics, 109( 7), 07A325-1-07325-3. doi:10.1063/1.3560895
NLM
Fukuhara M, Yonamine T, Landgraf FJG, Missell FP. Evolution of magnetic properties and crystallographic texture in electrical steel with large plastic deformation [Internet]. Journal of Applied Physics. 2011 ; 109( 7): 07A325-1-07325-3.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.3560895
Vancouver
Fukuhara M, Yonamine T, Landgraf FJG, Missell FP. Evolution of magnetic properties and crystallographic texture in electrical steel with large plastic deformation [Internet]. Journal of Applied Physics. 2011 ; 109( 7): 07A325-1-07325-3.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.3560895
Artigo de periodico
Short-range structure of 'Pb IND. 1-x''Ba IND. x''Zr IND. 0.65''Ti IND. 0.35''O IND. 3' ceramic compounds probed by XAS and Raman scattering techniques (2009)
Mastelaro, Valmor Roberto ; Mesquita, A.; Neves, P. P.; Michalowicz, A.; Bounif, M.; Pizani, P. S.; Joya, M. R.; Eiras, J. A.
Source: Journal of Applied Physics. Unidade: IFSC
Subjects: CRISTALOGRAFIA, MATERIAIS CERÂMICOS, ESPECTROSCOPIA RAMAN, DIFRAÇÃO POR RAIOS X, BÁRIO, SOLUÇÕES, ZIRCÔNIO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MASTELARO, Valmor Roberto et al. Short-range structure of 'Pb IND. 1-x''Ba IND. x''Zr IND. 0.65''Ti IND. 0.35''O IND. 3' ceramic compounds probed by XAS and Raman scattering techniques. Journal of Applied Physics, v. 105, n. 3, p. 033508-1-033508-6, 2009Tradução . . Disponível em: https://doi.org/10.1063/1.3073942. Acesso em: 09 nov. 2025.
APA
Mastelaro, V. R., Mesquita, A., Neves, P. P., Michalowicz, A., Bounif, M., Pizani, P. S., et al. (2009). Short-range structure of 'Pb IND. 1-x''Ba IND. x''Zr IND. 0.65''Ti IND. 0.35''O IND. 3' ceramic compounds probed by XAS and Raman scattering techniques. Journal of Applied Physics, 105( 3), 033508-1-033508-6. doi:10.1063/1.3073942
NLM
Mastelaro VR, Mesquita A, Neves PP, Michalowicz A, Bounif M, Pizani PS, Joya MR, Eiras JA. Short-range structure of 'Pb IND. 1-x''Ba IND. x''Zr IND. 0.65''Ti IND. 0.35''O IND. 3' ceramic compounds probed by XAS and Raman scattering techniques [Internet]. Journal of Applied Physics. 2009 ; 105( 3): 033508-1-033508-6.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.3073942
Vancouver
Mastelaro VR, Mesquita A, Neves PP, Michalowicz A, Bounif M, Pizani PS, Joya MR, Eiras JA. Short-range structure of 'Pb IND. 1-x''Ba IND. x''Zr IND. 0.65''Ti IND. 0.35''O IND. 3' ceramic compounds probed by XAS and Raman scattering techniques [Internet]. Journal of Applied Physics. 2009 ; 105( 3): 033508-1-033508-6.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.3073942
Artigo de periodico
Liquid junctions for characterization of electronic materials . Ii. Photoreflectance and electroreflectance of n-'SI' (1989)
Shen, W M; Fantini, Márcia Carvalho de Abreu ; Tomkiewicz, M; Gambino, J P
Source: Journal of Applied Physics. Unidade: IF
Assunto: CRISTALOGRAFIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SHEN, W M et al. Liquid junctions for characterization of electronic materials . Ii. Photoreflectance and electroreflectance of n-'SI'. Journal of Applied Physics, v. 66, n. 4 , p. 1759-64, 1989Tradução . . Acesso em: 09 nov. 2025.
APA
Shen, W. M., Fantini, M. C. de A., Tomkiewicz, M., & Gambino, J. P. (1989). Liquid junctions for characterization of electronic materials . Ii. Photoreflectance and electroreflectance of n-'SI'. Journal of Applied Physics, 66( 4 ), 1759-64.
NLM
Shen WM, Fantini MC de A, Tomkiewicz M, Gambino JP. Liquid junctions for characterization of electronic materials . Ii. Photoreflectance and electroreflectance of n-'SI'. Journal of Applied Physics. 1989 ;66( 4 ): 1759-64.[citado 2025 nov. 09 ]
Vancouver
Shen WM, Fantini MC de A, Tomkiewicz M, Gambino JP. Liquid junctions for characterization of electronic materials . Ii. Photoreflectance and electroreflectance of n-'SI'. Journal of Applied Physics. 1989 ;66( 4 ): 1759-64.[citado 2025 nov. 09 ]
Artigo de periodico
Liquid junctions for characterization of electronic materials . Iii. Modulation spectroscopies of reactive ion etching of si (1989)
Shen, W M; Fantini, Márcia Carvalho de Abreu ; Pollak, F H; Tomkiewicz, M; Leary, H; Gambino, J P
Source: Journal of Applied Physics. Unidade: IF
Assunto: CRISTALOGRAFIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SHEN, W M et al. Liquid junctions for characterization of electronic materials . Iii. Modulation spectroscopies of reactive ion etching of si. Journal of Applied Physics, v. 66, n. 4 , p. 1765-71, 1989Tradução . . Disponível em: https://doi.org/10.1063/1.344367. Acesso em: 09 nov. 2025.
APA
Shen, W. M., Fantini, M. C. de A., Pollak, F. H., Tomkiewicz, M., Leary, H., & Gambino, J. P. (1989). Liquid junctions for characterization of electronic materials . Iii. Modulation spectroscopies of reactive ion etching of si. Journal of Applied Physics, 66( 4 ), 1765-71. doi:10.1063/1.344367
NLM
Shen WM, Fantini MC de A, Pollak FH, Tomkiewicz M, Leary H, Gambino JP. Liquid junctions for characterization of electronic materials . Iii. Modulation spectroscopies of reactive ion etching of si [Internet]. Journal of Applied Physics. 1989 ;66( 4 ): 1765-71.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.344367
Vancouver
Shen WM, Fantini MC de A, Pollak FH, Tomkiewicz M, Leary H, Gambino JP. Liquid junctions for characterization of electronic materials . Iii. Modulation spectroscopies of reactive ion etching of si [Internet]. Journal of Applied Physics. 1989 ;66( 4 ): 1765-71.[citado 2025 nov. 09 ] Available from: https://doi.org/10.1063/1.344367

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