Raman characterization of structural disorder and residual strains in micromachined 'GA''AS' (2000)
Pizani, P S; Lanciotti Jr., F; Jasinevicius, Renato Goulart 
; Duduch, Jaime Gilberto ; Porto, Arthur José Vieira
Source: Journal of Applied Physics. Unidade: EESC
Assunto: MATÉRIA CONDENSADA (PROPRIEDADES MECÂNICAS)
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ABNT
PIZANI, P S et al. Raman characterization of structural disorder and residual strains in micromachined 'GA''AS'. Journal of Applied Physics, v. 87, n. 3, p. 1280-1283, 2000Tradução . . Disponível em: https://doi.org/10.1063/1.372009. Acesso em: 08 nov. 2025.APA
Pizani, P. S., Lanciotti Jr., F., Jasinevicius, R. G., Duduch, J. G., & Porto, A. J. V. (2000). Raman characterization of structural disorder and residual strains in micromachined 'GA''AS'. Journal of Applied Physics, 87( 3), 1280-1283. doi:10.1063/1.372009NLM
Pizani PS, Lanciotti Jr. F, Jasinevicius RG, Duduch JG, Porto AJV. Raman characterization of structural disorder and residual strains in micromachined 'GA''AS' [Internet]. Journal of Applied Physics. 2000 ; 87( 3): 1280-1283.[citado 2025 nov. 08 ] Available from: https://doi.org/10.1063/1.372009Vancouver
Pizani PS, Lanciotti Jr. F, Jasinevicius RG, Duduch JG, Porto AJV. Raman characterization of structural disorder and residual strains in micromachined 'GA''AS' [Internet]. Journal of Applied Physics. 2000 ; 87( 3): 1280-1283.[citado 2025 nov. 08 ] Available from: https://doi.org/10.1063/1.372009
