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Filtros : "JASINEVICIUS, RENATO GOULART" "Indexado no METADEX" Removido: "2012" Limpar

Filtros

Artigo de periodico
Annealing treatment of amorphous silicon generated by single point diamond turning (2007)
Jasinevicius, Renato Goulart; Pizani, Paulo Sérgio
Source: International Journal of Advanced Manufacturing Technology. Unidade: EESC
Subjects: SILICONE, DIAMANTE, RECOZIMENTO, ESPECTROSCOPIA RAMAN
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
JASINEVICIUS, Renato Goulart e PIZANI, Paulo Sérgio. Annealing treatment of amorphous silicon generated by single point diamond turning. International Journal of Advanced Manufacturing Technology, v. 34, n. 7-8, p. 680-688, 2007Tradução . . Disponível em: https://doi.org/10.1007/s00170-006-0650-z. Acesso em: 02 out. 2024.
APA
Jasinevicius, R. G., & Pizani, P. S. (2007). Annealing treatment of amorphous silicon generated by single point diamond turning. International Journal of Advanced Manufacturing Technology, 34( 7-8), 680-688. doi:10.1007/s00170-006-0650-z
NLM
Jasinevicius RG, Pizani PS. Annealing treatment of amorphous silicon generated by single point diamond turning [Internet]. International Journal of Advanced Manufacturing Technology. 2007 ; 34( 7-8): 680-688.[citado 2024 out. 02 ] Available from: https://doi.org/10.1007/s00170-006-0650-z
Vancouver
Jasinevicius RG, Pizani PS. Annealing treatment of amorphous silicon generated by single point diamond turning [Internet]. International Journal of Advanced Manufacturing Technology. 2007 ; 34( 7-8): 680-688.[citado 2024 out. 02 ] Available from: https://doi.org/10.1007/s00170-006-0650-z
Artigo de periodico
Characterization of structural alteration in diamond turned silicon crystal by means of micro raman spectroscopy and transmission electron microscopy (2005)
Jasinevicius, Renato Goulart; Porto, Arthur José Vieira; Pizani, Paulo Sérgio; Duduch, Jaime Gilberto; Santos, Francisco José
Source: Materials Research. Unidade: EESC
Subjects: SEMICONDUTORES, MUDANÇA DE FASE, DUCTILIDADE
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
JASINEVICIUS, Renato Goulart et al. Characterization of structural alteration in diamond turned silicon crystal by means of micro raman spectroscopy and transmission electron microscopy. Materials Research, v. 8, n. 3, p. 261-268, 2005Tradução . . Disponível em: https://doi.org/10.1590/s1516-14392005000300007. Acesso em: 02 out. 2024.
APA
Jasinevicius, R. G., Porto, A. J. V., Pizani, P. S., Duduch, J. G., & Santos, F. J. (2005). Characterization of structural alteration in diamond turned silicon crystal by means of micro raman spectroscopy and transmission electron microscopy. Materials Research, 8( 3), 261-268. doi:10.1590/s1516-14392005000300007
NLM
Jasinevicius RG, Porto AJV, Pizani PS, Duduch JG, Santos FJ. Characterization of structural alteration in diamond turned silicon crystal by means of micro raman spectroscopy and transmission electron microscopy [Internet]. Materials Research. 2005 ; 8( 3): 261-268.[citado 2024 out. 02 ] Available from: https://doi.org/10.1590/s1516-14392005000300007
Vancouver
Jasinevicius RG, Porto AJV, Pizani PS, Duduch JG, Santos FJ. Characterization of structural alteration in diamond turned silicon crystal by means of micro raman spectroscopy and transmission electron microscopy [Internet]. Materials Research. 2005 ; 8( 3): 261-268.[citado 2024 out. 02 ] Available from: https://doi.org/10.1590/s1516-14392005000300007

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