Lima, Cícero Ribeiro de; Mello, Luís Augusto Motta; González Lima, Raúl 
; Silva, Emílio Carlos Nelli
Source: Measurement Science and Technology. Unidade: EP
Subjects: TOPOLOGIA (OTIMIZAÇÃO), TOMOGRAFIA, MÉTODO DOS ELEMENTOS FINITOS, PROCESSAMENTO DE IMAGENS
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ABNT
LIMA, Cícero Ribeiro de et al. Electrical impedance tomography through constrained sequential linear programming: a topology optimization approach. Measurement Science and Technology, n. 9, p. 2847-2858, 2007Tradução . . Disponível em: https://doi.org/10.1088/0957-0233/18/9/014. Acesso em: 05 dez. 2025.APA
Lima, C. R. de, Mello, L. A. M., González Lima, R., & Silva, E. C. N. (2007). Electrical impedance tomography through constrained sequential linear programming: a topology optimization approach. Measurement Science and Technology, ( 9), 2847-2858. doi:10.1088/0957-0233/18/9/014NLM
Lima CR de, Mello LAM, González Lima R, Silva ECN. Electrical impedance tomography through constrained sequential linear programming: a topology optimization approach [Internet]. Measurement Science and Technology. 2007 ;( 9): 2847-2858.[citado 2025 dez. 05 ] Available from: https://doi.org/10.1088/0957-0233/18/9/014Vancouver
Lima CR de, Mello LAM, González Lima R, Silva ECN. Electrical impedance tomography through constrained sequential linear programming: a topology optimization approach [Internet]. Measurement Science and Technology. 2007 ;( 9): 2847-2858.[citado 2025 dez. 05 ] Available from: https://doi.org/10.1088/0957-0233/18/9/014
