Effective layer pruning through similarity metric perspective (2025)
Pons, Ian; Yamamoto, Bruno Lopes; Reali Costa, Anna Helena 
; Correia, Artur Jordão Lima
Source: Lecture Notes in Computer Science. Conference titles: International Conference on Pattern Recognition - ICPR 2024:Proceedings-Part V. Unidade: EP
Subjects: APRENDIZAGEM PROFUNDA, REDES NEURAIS, ESPAÇOS MÉTRICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
PONS, Ian et al. Effective layer pruning through similarity metric perspective. Lecture Notes in Computer Science. Cham: Springer. Disponível em: https://doi.org/10.1007/978-3-031-78169-8_8. Acesso em: 12 nov. 2025. , 2025APA
Pons, I., Yamamoto, B. L., Reali Costa, A. H., & Correia, A. J. L. (2025). Effective layer pruning through similarity metric perspective. Lecture Notes in Computer Science. Cham: Springer. doi:10.1007/978-3-031-78169-8_28NLM
Pons I, Yamamoto BL, Reali Costa AH, Correia AJL. Effective layer pruning through similarity metric perspective [Internet]. Lecture Notes in Computer Science. 2025 ; 15305 423-438.[citado 2025 nov. 12 ] Available from: https://doi.org/10.1007/978-3-031-78169-8_8Vancouver
Pons I, Yamamoto BL, Reali Costa AH, Correia AJL. Effective layer pruning through similarity metric perspective [Internet]. Lecture Notes in Computer Science. 2025 ; 15305 423-438.[citado 2025 nov. 12 ] Available from: https://doi.org/10.1007/978-3-031-78169-8_8
