Source: Abstracts. Conference titles: Congresso Brasileiro de Microscopia de Materiais. Unidades: IF, IFSC
Assunto: MICROSCOPIA ELETRÔNICA
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SILVA, M. J. da et al. AFM characterization of the spontaneous step alignment of InAs quantum dots along their evolution cycle. 2000, Anais.. São Carlos: UFSCAR, 2000. . Acesso em: 17 out. 2024.APA
Silva, M. J. da, Quivy, A. A., Borrero, P. P. G., & Marega Junior, E. (2000). AFM characterization of the spontaneous step alignment of InAs quantum dots along their evolution cycle. In Abstracts. São Carlos: UFSCAR.NLM
Silva MJ da, Quivy AA, Borrero PPG, Marega Junior E. AFM characterization of the spontaneous step alignment of InAs quantum dots along their evolution cycle. Abstracts. 2000 ;[citado 2024 out. 17 ]Vancouver
Silva MJ da, Quivy AA, Borrero PPG, Marega Junior E. AFM characterization of the spontaneous step alignment of InAs quantum dots along their evolution cycle. Abstracts. 2000 ;[citado 2024 out. 17 ]