Scanning tunneling microscopy as a tool for doping studies in semiconductors (2000)
Source: Abstracts. Conference titles: Congresso Brasileiro de Microscopia de Materiais. Unidade: IF
Subjects: MICROSCOPIA ELETRÔNICA, SEMICONDUTORES
ABNT
LAMAS, T. E. e QUIVY, A. A. Scanning tunneling microscopy as a tool for doping studies in semiconductors. 2000, Anais.. São Carlos: UFSCAR, 2000. . Acesso em: 17 out. 2024.APA
Lamas, T. E., & Quivy, A. A. (2000). Scanning tunneling microscopy as a tool for doping studies in semiconductors. In Abstracts. São Carlos: UFSCAR.NLM
Lamas TE, Quivy AA. Scanning tunneling microscopy as a tool for doping studies in semiconductors. Abstracts. 2000 ;[citado 2024 out. 17 ]Vancouver
Lamas TE, Quivy AA. Scanning tunneling microscopy as a tool for doping studies in semiconductors. Abstracts. 2000 ;[citado 2024 out. 17 ]