Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film (1990)
Fonte: Program and Abstracts. Nome do evento: Spring Meeting of the Materials Research Society. Unidade: IFSC
Assunto: FÍSICA
ABNT
OHSAKI, H e AEGERTER, Michel André. Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film. 1990, Anais.. Pittsburgh: Materials Research Society, 1990. Disponível em: https://repositorio.usp.br/directbitstream/7f73ff9d-a425-42a5-b146-c47025425763/PROD001385_804061.pdf. Acesso em: 03 nov. 2025.APA
Ohsaki, H., & Aegerter, M. A. (1990). Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film. In Program and Abstracts. Pittsburgh: Materials Research Society. Recuperado de https://repositorio.usp.br/directbitstream/7f73ff9d-a425-42a5-b146-c47025425763/PROD001385_804061.pdfNLM
Ohsaki H, Aegerter MA. Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film [Internet]. Program and Abstracts. 1990 ;[citado 2025 nov. 03 ] Available from: https://repositorio.usp.br/directbitstream/7f73ff9d-a425-42a5-b146-c47025425763/PROD001385_804061.pdfVancouver
Ohsaki H, Aegerter MA. Electron diffraction analysis of the structure of 'SI''O IND.2' gel-film [Internet]. Program and Abstracts. 1990 ;[citado 2025 nov. 03 ] Available from: https://repositorio.usp.br/directbitstream/7f73ff9d-a425-42a5-b146-c47025425763/PROD001385_804061.pdf