Filtros : "Journal of Statistical Computation and Simulation" "2020" Limpar

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  • Source: Journal of Statistical Computation and Simulation. Unidade: EP

    Subjects: GRÁFICOS, ESTATÍSTICA

    PrivadoAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      QUININO, Roberto da Costa et al. A control chart to monitor the process mean based on inspecting attributes using control limits of the traditional X-bar chart. Journal of Statistical Computation and Simulation, v. 90, n. 9, p. 1639-1660, 2020Tradução . . Disponível em: https://doi.org/10.1080/00949655.2020.1741588. Acesso em: 02 jul. 2025.
    • APA

      Quinino, R. da C., Ho, L. L., Cruz, F. R. B. da, & Bessegato, L. F. (2020). A control chart to monitor the process mean based on inspecting attributes using control limits of the traditional X-bar chart. Journal of Statistical Computation and Simulation, 90( 9), 1639-1660. doi:10.1080/00949655.2020.1741588
    • NLM

      Quinino R da C, Ho LL, Cruz FRB da, Bessegato LF. A control chart to monitor the process mean based on inspecting attributes using control limits of the traditional X-bar chart [Internet]. Journal of Statistical Computation and Simulation. 2020 ; 90( 9): 1639-1660.[citado 2025 jul. 02 ] Available from: https://doi.org/10.1080/00949655.2020.1741588
    • Vancouver

      Quinino R da C, Ho LL, Cruz FRB da, Bessegato LF. A control chart to monitor the process mean based on inspecting attributes using control limits of the traditional X-bar chart [Internet]. Journal of Statistical Computation and Simulation. 2020 ; 90( 9): 1639-1660.[citado 2025 jul. 02 ] Available from: https://doi.org/10.1080/00949655.2020.1741588
  • Source: Journal of Statistical Computation and Simulation. Unidade: IME

    Subjects: ANÁLISE DE SÉRIES TEMPORAIS, INFERÊNCIA PARAMÉTRICA

    Versão AceitaAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      CHOU-CHEN, Shu Wei e MORETTIN, Pedro Alberto. Indirect inference for locally stationary ARMA processes with stable innovations. Journal of Statistical Computation and Simulation, v. 90, n. 17, p. 3106-3134, 2020Tradução . . Disponível em: https://doi.org/10.1080/00949655.2020.1797030. Acesso em: 02 jul. 2025.
    • APA

      Chou-Chen, S. W., & Morettin, P. A. (2020). Indirect inference for locally stationary ARMA processes with stable innovations. Journal of Statistical Computation and Simulation, 90( 17), 3106-3134. doi:10.1080/00949655.2020.1797030
    • NLM

      Chou-Chen SW, Morettin PA. Indirect inference for locally stationary ARMA processes with stable innovations [Internet]. Journal of Statistical Computation and Simulation. 2020 ; 90( 17): 3106-3134.[citado 2025 jul. 02 ] Available from: https://doi.org/10.1080/00949655.2020.1797030
    • Vancouver

      Chou-Chen SW, Morettin PA. Indirect inference for locally stationary ARMA processes with stable innovations [Internet]. Journal of Statistical Computation and Simulation. 2020 ; 90( 17): 3106-3134.[citado 2025 jul. 02 ] Available from: https://doi.org/10.1080/00949655.2020.1797030

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