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Filtros : "Applied Physics Letters" "Financiamento FAPESP" Removido: "DIELÉTRICOS (PROPRIEDADES)" Limpar

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  • Artigo de periodico

    Revealing localized excitons in WSe2/β-Ga2O3 (2024)

    Cavalini, Camila ; Rabahi, César Ricardo ; Brito, Caique Serati de ; Lee, Eunji ; Toledo, José Roberto de ; Cazetta, Felipe Faria ; Oliveira, Raphael Brenon Fernandes de ; Andrade, Marcelo Barbosa de ; Henini, Mohamed ; Zhang, Yuhao ; Kim, Jeongyong ; Barcelos, Ingrid David ; Gobato, Yara Galvão

    Source: Applied Physics Letters. Unidade: IFSC

    Subjects: ÓPTICA, FOTÔNICA, FOTOLUMINESCÊNCIA

    Versão PublicadaAcesso à fonteDOIHow to cite
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    • ABNT

      CAVALINI, Camila et al. Revealing localized excitons in WSe2/β-Ga2O3. Applied Physics Letters, v. 124, n. 14, p. 142104-1-142104-7 + supplementary material, 2024Tradução . . Disponível em: https://doi.org/10.1063/5.0203628. Acesso em: 04 nov. 2025.

    • APA

      Cavalini, C., Rabahi, C. R., Brito, C. S. de, Lee, E., Toledo, J. R. de, Cazetta, F. F., et al. (2024). Revealing localized excitons in WSe2/β-Ga2O3. Applied Physics Letters, 124( 14), 142104-1-142104-7 + supplementary material. doi:10.1063/5.0203628

    • NLM

      Cavalini C, Rabahi CR, Brito CS de, Lee E, Toledo JR de, Cazetta FF, Oliveira RBF de, Andrade MB de, Henini M, Zhang Y, Kim J, Barcelos ID, Gobato YG. Revealing localized excitons in WSe2/β-Ga2O3 [Internet]. Applied Physics Letters. 2024 ; 124( 14): 142104-1-142104-7 + supplementary material.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/5.0203628

    • Vancouver

      Cavalini C, Rabahi CR, Brito CS de, Lee E, Toledo JR de, Cazetta FF, Oliveira RBF de, Andrade MB de, Henini M, Zhang Y, Kim J, Barcelos ID, Gobato YG. Revealing localized excitons in WSe2/β-Ga2O3 [Internet]. Applied Physics Letters. 2024 ; 124( 14): 142104-1-142104-7 + supplementary material.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/5.0203628

  • Artigo de periodico

    Determination of thickness and optical constants of amorphous silicon films from transmittance data (2000)

    Mulato, Marcelo; Chambouleyron, Ivan Emílio; Birgin, Ernesto Julian Goldberg ; Martínez, José Mário

    Source: Applied Physics Letters. Unidade: IME

    Subjects: FÍSICA, ÓPTICA

    PrivadoAcesso à fonteDOIHow to cite
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    • ABNT

      MULATO, Marcelo et al. Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, v. 77, n. 14, p. 2133-2135, 2000Tradução . . Disponível em: https://doi.org/10.1063/1.1314299. Acesso em: 04 nov. 2025.

    • APA

      Mulato, M., Chambouleyron, I. E., Birgin, E. J. G., & Martínez, J. M. (2000). Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, 77( 14), 2133-2135. doi:10.1063/1.1314299

    • NLM

      Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299

    • Vancouver

      Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299
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