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Filtros : "Applied Physics Letters" "Financiamento CNPq" Removido: "2024" Limpar

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  • Artigo de periodico

    Piezoelectric-magnetic behavior of ferroelectrets coated with magnetic layer (2021)

    Altafim, Ruy Alberto Pisani; Assagra, Yuri Andrey Olivato; Altafim, Ruy Alberto Corrêa ; Carmo, João Paulo Pereira do ; Palitó, Thamyres Tâmulla Cavalcante; Santos, A. M.; Rychkov, Dmitry

    Source: Applied Physics Letters. Unidade: EESC

    Subjects: FERROELETRICIDADE, PIEZOELETRICIDADE

    PrivadoAcesso à fonteDOIHow to cite
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    • ABNT

      ALTAFIM, Ruy Alberto Pisani et al. Piezoelectric-magnetic behavior of ferroelectrets coated with magnetic layer. Applied Physics Letters, v. 119, n. 24, 2021Tradução . . Disponível em: http://dx.doi.org/10.1063/5.0071231. Acesso em: 04 nov. 2025.

    • APA

      Altafim, R. A. P., Assagra, Y. A. O., Altafim, R. A. C., Carmo, J. P. P. do, Palitó, T. T. C., Santos, A. M., & Rychkov, D. (2021). Piezoelectric-magnetic behavior of ferroelectrets coated with magnetic layer. Applied Physics Letters, 119( 24). doi:10.1063/5.0071231

    • NLM

      Altafim RAP, Assagra YAO, Altafim RAC, Carmo JPP do, Palitó TTC, Santos AM, Rychkov D. Piezoelectric-magnetic behavior of ferroelectrets coated with magnetic layer [Internet]. Applied Physics Letters. 2021 ; 119( 24):[citado 2025 nov. 04 ] Available from: http://dx.doi.org/10.1063/5.0071231

    • Vancouver

      Altafim RAP, Assagra YAO, Altafim RAC, Carmo JPP do, Palitó TTC, Santos AM, Rychkov D. Piezoelectric-magnetic behavior of ferroelectrets coated with magnetic layer [Internet]. Applied Physics Letters. 2021 ; 119( 24):[citado 2025 nov. 04 ] Available from: http://dx.doi.org/10.1063/5.0071231

  • Artigo de periodico

    Determination of thickness and optical constants of amorphous silicon films from transmittance data (2000)

    Mulato, Marcelo; Chambouleyron, Ivan Emílio; Birgin, Ernesto Julian Goldberg ; Martínez, José Mário

    Source: Applied Physics Letters. Unidade: IME

    Subjects: FÍSICA, ÓPTICA

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    • ABNT

      MULATO, Marcelo et al. Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, v. 77, n. 14, p. 2133-2135, 2000Tradução . . Disponível em: https://doi.org/10.1063/1.1314299. Acesso em: 04 nov. 2025.

    • APA

      Mulato, M., Chambouleyron, I. E., Birgin, E. J. G., & Martínez, J. M. (2000). Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, 77( 14), 2133-2135. doi:10.1063/1.1314299

    • NLM

      Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299

    • Vancouver

      Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299
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