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Filtros : "Applied Physics Letters" "Financiado pela CAPES" Removido: "CRISTALOGRAFIA FÍSICA" Limpar

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  • Artigo de periodico

    Raman spectroscopy of GaSb1-xBix alloys with high Bi content (2020)

    Souto, Sérgio Paulo Amaral; Gobato, Y. Galvão; Souza, D.; Andrade, Marcelo Barbosa de ; Koivusalo, E.; Puustinen, J.; Guina, M.

    Source: Applied Physics Letters. Unidades: FZEA, IFSC

    Subjects: ESPECTROSCOPIA RAMAN, POLÍMEROS (MATERIAIS)

    Versão PublicadaAcesso à fonteDOIHow to cite
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    • ABNT

      SOUTO, Sérgio Paulo Amaral et al. Raman spectroscopy of GaSb1-xBix alloys with high Bi content. Applied Physics Letters, v. 116, n. 20, p. 202103-1-202103-5, 2020Tradução . . Disponível em: https://doi.org/10.1063/5.0008100. Acesso em: 04 nov. 2025.

    • APA

      Souto, S. P. A., Gobato, Y. G., Souza, D., Andrade, M. B. de, Koivusalo, E., Puustinen, J., & Guina, M. (2020). Raman spectroscopy of GaSb1-xBix alloys with high Bi content. Applied Physics Letters, 116( 20), 202103-1-202103-5. doi:10.1063/5.0008100

    • NLM

      Souto SPA, Gobato YG, Souza D, Andrade MB de, Koivusalo E, Puustinen J, Guina M. Raman spectroscopy of GaSb1-xBix alloys with high Bi content [Internet]. Applied Physics Letters. 2020 ; 116( 20): 202103-1-202103-5.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/5.0008100

    • Vancouver

      Souto SPA, Gobato YG, Souza D, Andrade MB de, Koivusalo E, Puustinen J, Guina M. Raman spectroscopy of GaSb1-xBix alloys with high Bi content [Internet]. Applied Physics Letters. 2020 ; 116( 20): 202103-1-202103-5.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/5.0008100

  • Artigo de periodico

    Monitoring the dispersion and agglomeration of silver nanoparticles in polymer thin films using localized surface plasmons and Ferrell plasmons (2020)

    Hensel, Rafael C.; Moreira, Murilo; Riul Jr., Antonio; Oliveira Junior, Osvaldo Novais de ; Rodrigues, Varlei; Hillenkamp, Matthias

    Source: Applied Physics Letters. Unidade: IFSC

    Subjects: POLÍMEROS (MATERIAIS), PRATA, NANOPARTÍCULAS

    Versão PublicadaAcesso à fonteDOIHow to cite
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    • ABNT

      HENSEL, Rafael C. et al. Monitoring the dispersion and agglomeration of silver nanoparticles in polymer thin films using localized surface plasmons and Ferrell plasmons. Applied Physics Letters, v. 116, n. 10, p. 103105-1-103105-4, 2020Tradução . . Disponível em: https://doi.org/10.1063/1.5140247. Acesso em: 04 nov. 2025.

    • APA

      Hensel, R. C., Moreira, M., Riul Jr., A., Oliveira Junior, O. N. de, Rodrigues, V., & Hillenkamp, M. (2020). Monitoring the dispersion and agglomeration of silver nanoparticles in polymer thin films using localized surface plasmons and Ferrell plasmons. Applied Physics Letters, 116( 10), 103105-1-103105-4. doi:10.1063/1.5140247

    • NLM

      Hensel RC, Moreira M, Riul Jr. A, Oliveira Junior ON de, Rodrigues V, Hillenkamp M. Monitoring the dispersion and agglomeration of silver nanoparticles in polymer thin films using localized surface plasmons and Ferrell plasmons [Internet]. Applied Physics Letters. 2020 ; 116( 10): 103105-1-103105-4.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/1.5140247

    • Vancouver

      Hensel RC, Moreira M, Riul Jr. A, Oliveira Junior ON de, Rodrigues V, Hillenkamp M. Monitoring the dispersion and agglomeration of silver nanoparticles in polymer thin films using localized surface plasmons and Ferrell plasmons [Internet]. Applied Physics Letters. 2020 ; 116( 10): 103105-1-103105-4.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1063/1.5140247
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