Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam (1998)
Martinelli, Marcelo 
; Bian, S; Leite, J. R.; Horowicz, Ricardo Josué
Source: Applied Physics Letters. Unidade: IF
Assunto: FÍSICA
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ABNT
MARTINELLI, Marcelo et al. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam. Applied Physics Letters, v. 72, n. 12, p. 1427-1429, 1998Tradução . . Disponível em: https://doi.org/10.1063/1.120584. Acesso em: 06 nov. 2025.APA
Martinelli, M., Bian, S., Leite, J. R., & Horowicz, R. J. (1998). Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam. Applied Physics Letters, 72( 12), 1427-1429. doi:10.1063/1.120584NLM
Martinelli M, Bian S, Leite JR, Horowicz RJ. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam [Internet]. Applied Physics Letters. 1998 ; 72( 12): 1427-1429.[citado 2025 nov. 06 ] Available from: https://doi.org/10.1063/1.120584Vancouver
Martinelli M, Bian S, Leite JR, Horowicz RJ. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam [Internet]. Applied Physics Letters. 1998 ; 72( 12): 1427-1429.[citado 2025 nov. 06 ] Available from: https://doi.org/10.1063/1.120584
