Comparative study of defect energetics in Hf'O IND.2' and Si'O IND. 2' (2004)
Scopel, W L; Silva, Antonio Jose Roque da; Orellana, W; Fazzio, Adalberto 
Source: Applied Physics Letters. Unidade: IF
Subjects: FILMES FINOS, MATÉRIA CONDENSADA
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SCOPEL, W L et al. Comparative study of defect energetics in Hf'O IND.2' and Si'O IND. 2'. Applied Physics Letters, 2004Tradução . . Disponível em: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000084000009001492000001&idtype=cvips. Acesso em: 04 nov. 2025.APA
Scopel, W. L., Silva, A. J. R. da, Orellana, W., & Fazzio, A. (2004). Comparative study of defect energetics in Hf'O IND.2' and Si'O IND. 2'. Applied Physics Letters. Recuperado de http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000084000009001492000001&idtype=cvipsNLM
Scopel WL, Silva AJR da, Orellana W, Fazzio A. Comparative study of defect energetics in Hf'O IND.2' and Si'O IND. 2' [Internet]. Applied Physics Letters. 2004 ;[citado 2025 nov. 04 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000084000009001492000001&idtype=cvipsVancouver
Scopel WL, Silva AJR da, Orellana W, Fazzio A. Comparative study of defect energetics in Hf'O IND.2' and Si'O IND. 2' [Internet]. Applied Physics Letters. 2004 ;[citado 2025 nov. 04 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000084000009001492000001&idtype=cvips
