Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SUPERFÍCIE FÍSICA, LUMINESCÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SOUZA NETO, Narcizo M et al. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, v. 42, n. 6, p. 1158-1164, 2009Tradução . . Disponível em: https://doi.org/10.1107/s0021889809042678. Acesso em: 04 nov. 2025.APA
Souza Neto, N. M., Ramos, A. Y., Tolentino, H. C. N., Martins, A., & Santos, A. D. (2009). Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, 42( 6), 1158-1164. doi:10.1107/s0021889809042678NLM
Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1107/s0021889809042678Vancouver
Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.[citado 2025 nov. 04 ] Available from: https://doi.org/10.1107/s0021889809042678
